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Author: M. Ge


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Reference
C. A. Cooper et al., “Recent Developments in Electropolishing and Tumbling R&D at Fermilab”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper THPPO076, pp. 806-810.
C. M. Ginsburg et al., “1.3 GHz Superconducting RF Cavity Program at Fermilab”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper FROBS5, pp. 2586-2588.
D. Gonnella et al., “The LCLS-II HE High Q and Gradient R&D Program”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 154-158.
D. L. Hall, M. Ge, J. J. Kaufman, M. Liepe, and R. D. Porter, “Impact of Cooldown Procedure and Ambient Magnetic Field on the Quality Factor of State-of-the-Art Nb3Sn Single-Cell ILC Cavities”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 215-217.
D. Trbojevic et al., “CBETA - Cornell University Brookhaven National Laboratory Electron Energy Recovery Test Accelerator”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 1285-1289.
F. Furuta et al., “Advanced Vertical Electro-Polishing studies at Cornell with Faraday”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 233-236.
F. Furuta et al., “ERL Cryomodule Testing and Beam Capabilities”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 3010-3013.
F. Furuta et al., “HF Free Bipolar Electro-Polishing Studies on Niobium SRF Cavities at Cornell With Faraday Technology”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2443-2446.
F. Furuta et al., “High-efficiency, High-current Optimized Main-linac ERL Cryomodule”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 935-940.
F. Furuta et al., “HOM Measurements for Cornell's ERL Main Linac Cryomodule”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 496-499.


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