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Author: P. Michelato


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Reference
S. Schreiber, S. Lederer, P. Michelato, L. Monaco, and D. Sertore, “Update on the Lifetime of Cs2Te Photocathodes Operated at FLASH”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 415-418.
M. Bertucci et al., “Surface Treatments for the Series Production of ESS Medium Beta Cavities”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 188-193.
M. Bertucci et al., “Electropolishing of PIP-II Low Beta Cavity Prototypes”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 194-198.
D. Sertore et al., “ESS Medium Beta Activity at INFN LASA”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 199-204.
R. Paparella et al., “INFN-LASA for the PIP-II Project”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 205-209.
M. Bertucci et al., “Upgrade on the Experimental Activities for ESS at the LASA Vertical Test Facility”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 1133-1138.
I. Drebot et al., “X-Ray ICS Source Based on Modified Push-Pull ERLs”, in Proc. 63rd Advanced ICFA Beam Dynamics Workshop on Energy Recovery Linacs (ERL'19), Berlin, Germany, Sep. 2019, pp. 84-89.
L. Monaco, G. Guerini Rocco, P. Michelato, C. Pagani, and D. Sertore, “Growing and Characterization of Cs2Te Photocatodes with Different Thicknesses at INFN LASA”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 297-300.
S. K. Mohanty, G. Guerini Rocco, P. Michelato, L. Monaco, C. Pagani, and D. Sertore, “Development of a Multialkali Antimonide Photocathode at INFN LASA”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 448-451.
P. W. Huang et al., “Test of Cs2Te Thickness on Cathode Performance at PITZ”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 473-476.


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