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Author: R. L. Geng


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Reference
T. Saeki et al., “Studies on the Electro-Polishing process with Nb sample plates at KEK.”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper THPPO086, pp. 829-829.
R. L. Geng, “Overview of High Gradient SRF R&D for ILC Cavities at Jefferson Lab”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO015, pp. 213-217.
B. Xiao et al., “RF Surface Impedance Measurement of Polycrystalline and Large Grain Nb Disk Sample at 7.5 GHz”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO042, pp. 305-308.
R. L. Geng, G. Ciovati, and A. C. Crawford, “Gradient Limiting Defects in 9-Cell Cavities EP Processed and RF Tested at Jefferson Lab”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO059, pp. 370-374.
X. Zhao et al., “Surface Characterization of Niobium Samples Electropolished Together with Real Cavities”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUPPO086, pp. 441-445.
C. Boffo, P. Bauer, T. Reid, and R. L. Geng, “Electropolishing on Small Samples at Fermilab”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper THP01, pp. 447-450.
R. L. Geng, C. Crawford, H. Padamsee, and A. Seaman, “Vertical Electropolishing Niobium Cavities”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper THP04, pp. 459-463.
R. L. Geng et al., “Two-Cell Niobium Injector Cavity for Cornell ERL Prototype”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper THP22, pp. 510-510.
M. Liepe et al., “The CW Cornell ERL Injector Cryomodule”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper THP41, pp. 557-557.
R. L. Geng, “Review of New Shapes for Higher Gradients”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper TUA04, pp. 175-180.


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