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Author: C. P. Welsch


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Reference
J. Wolfenden et al., “Optical Effects in High Resolution and High Dynamic Range Beam Imaging Systems”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 844-847.
C. P. Welsch, “Advances in Diagnostics for Medical Accelerators”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 37-40.
C. P. Welsch, “Beam Diagnostics for Low Energy Antiproton Beams”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 77-80.
T. Sieber et al., “Optimization of the Cryogenic Current Comparator (CCC) for Beam Intensity Measurement”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 503-506.
S. Udrea et al., “Development of a Fluorescence Based Gas Sheet Profile Monitor for Use With Electron Lenses: Optical System Design and Preparatory Experiments”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 359-363.
A. S. Alexandrova et al., “Optical Beam Loss Monitor for RF Cavity Characterisation”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 446-449.
C. P. Welsch, “Development of Beyond State-of-the-art Diagnostic Techniques within the European Network DITANET”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper THVTS02, pp. 363-367.
C. P. Welsch, E. Bravin, A. E. Dabrowski, and T. Lef?¿vre, “Status of the CTF3 Synchrotron Light Monitoring System”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF027, pp. 162-166.
M. Putignano and C. P. Welsch, “Numerical Studies of Curtain Gas Jet Generation for Beam Profile Monitoring Applications in the Ultra Low Energy Storage Ring”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM045, pp. 243-246.
A. Intermite, M. Putignano, and C. P. Welsch, “Influence of Dark Count on the Performance of Silicon Photomultipliers”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM046, pp. 247-251.


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