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Author: D. C. Nguyen


References



Reference
J. W. Lewellen et al., “Technology Maturation for the MaRIE 1.0 X-FEL”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 181-184.
J. W. Lewellen et al., “Status of the MaRIE X-FEL Accelerator Design”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1894-1896.
J. W. Lewellen et al., “Linac Design Elements for Spaceborne Accelerators”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4291-4293.
H. Bluem et al., “High Brightness Electron Guns for Next-Generation Light Sources and Accelerators”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper MOPLT156, pp. 899-901.
H. Bluem et al., “Electron Gun and Injector Designs for State-of-the-Art FELs”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP054, pp. XX-XX.
G. Marcus et al., “X-ray Regenerative Amplifier Free-Electron Laser Concepts for LCLS-II”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 192-195.
F. L. Krawczyk, S. J. Cooke, D. C. Nguyen, B. Rusnak, T. I. Smith, and E. L. Wright, “RF Design of a Spoke Resonator for High Power Free-Electron Lasers”, in Proc. 24th Linear Accelerator Conf. (LINAC'08), Victoria, Canada, Sep.-Oct. 2008, paper THP037, pp. 866-866.
F. L. Krawczyk et al., “RF-loss Measurements in an Open Coaxial Resonator for Characterization of Copper Plating”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper WEPMS021, pp. 2376-2378.
F. L. Krawczyk et al., “Initial RF Measurements of the CW Normal-Conducting RF Injector”, in Proc. 24th Linear Accelerator Conf. (LINAC'08), Victoria, Canada, Sep.-Oct. 2008, paper TUP108, pp. 656-657.
E. A. Nanni et al., “Design of a Field-Emission X-Band Gun Driven by Solid-State RF Source”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 4399-4402.


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