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Author: K. Honkavaara


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Reference
E. Prat, W. Decking, K. Honkavaara, T. Limberg, and F. Loehl, “Beam Profile Measurements and Analysis at FLASH”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper THPAN026, pp. 3283-3285.
F. Loehl, E. Prat, and K. Honkavaara, “Measurements of Projected Emittances at FLASH”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper WEPPH008, pp. 338-341.
S. Pfeiffer et al., “Status Update of the Fast Energy Corrector Cavity at FLASH”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 112-114.
K. Honkavaara, Y. Kim, and F. Loehl, “Measurements of Transverse Emittance at the TTF VUV-FEL”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper POM021, pp. XX-XX.
S. Schreiber et al., “Improved Operation of the TTF Photoinjector for FEL Operation”, in Proc. 8th European Particle Accelerator Conf. (EPAC'02), Paris, France, Jun. 2002, paper TUPRI052, pp. 1804-1806.
A. Cianchi et al., “Commissioning of the OTR Beam Profile Monitor System at TTF/VUV-FEL Injector”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper THPLT058, pp. 2619-2621.
X. Artru et al., “Experimental Investigations on Geometrical Resolution of Electron Beam Profiles given by OTR in the GeV Energy Range”, in Proc. 5th European Particle Accelerator Conf. (EPAC'96), Sitges, Spain, Jun. 1996, paper TUP060L, pp. 1686-1688.
K. Honkavaara et al., “Transverse Electron Beam Diagnostics at the VUV-FEL at DESY”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP038, pp. XX-XX.
M. Roehrs, A. Bolzmann, K. Honkavaara, M. Huening, and H. Schlarb, “Measurement of Slice-Emmittance using Transverse Deflecting Structure”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP036, pp. XX-XX.
K. Honkavaara, “Electron Beam Characterization at PITZ and the VUV-FEL at DESY”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper WEOB001, pp. XX-XX.


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