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Author: J. H. Park


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Reference
S. J. Park et al., “Developmental Status of PEFP/KAERI Beam Diagnostic System”, in Proc. 3rd Asian Particle Accelerator Conf. (APAC'04), Gyeongju, Korea, Mar. 2004, paper THP21013, pp. XX-XX.
S. J. Park et al., “Physics and Engineering Issues of PPI (Pohang Photo-Injector) for PAL XFEL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP054, pp. XX-XX.
S. J. Park et al., “Status of PPI (Pohang Photo-Injector) for PAL XFEL”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP021, pp. 1733-1735.
T.-Y. Lee et al., “Design Status of PAL-XFEL”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper MOPPH071, pp. 210-213.
V. Yakimenko et al., “Generation of Bunch Trains and Its Applications”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TH3GBI03, pp. 3106-3109.
W. Sch?Âllkopf et al., “First Lasing of the IR FEL at the Fritz-Haber-Institut Berlin”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOOB01, pp. XX-XX.
W. Sch?Âllkopf et al., “Status of the Fritz Haber Institute THz FEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPB30, pp. 315-317.
Y. B. Kong, M. G. Hur, E. J. Lee, J. H. Park, H. S. Song, and S. D. Yang, “Deep Learning Based Predictive Control for RFT-30 Cyclotron”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2230-2232.
Y. B. Kong, M. G. Hur, E. J. Lee, J. H. Park, S. D. Yang, and Y. D. Park, “Neural Network Based Generalized Predictive Control for RFT-30 Cyclotron System”, in Proc. 21th Int. Conf. on Cyclotrons and their Applications (Cyclotrons'16), Zurich, Switzerland, Sep. 2016, pp. 212-214.
Y. W. Parc et al., “Electro-Optic Sampling Method Using High DC Voltage Applying Setup”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH045, pp. 692-694.


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