|
C. Vicario et al., “Photocathode Drive Laser for SwissFEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB14, pp. 425-428. |
|
M. Pedrozzi et al., “SwissFEL Injector Test Facility ÔÇô Test and Plans”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB30, pp. 625-628. |
|
C. Vicario et al., “Timing Jitter Measurements of the SwissFEL Test Injector”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper MOPSO77, pp. 140-143. |
|
E. Prat et al., “Slice Emittance Optimization at the SwissFEL Injector Test Facility”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUOCNO06, pp. 200-204. |
|
R. Ganter et al., “SwissFEL Cathode Load-lock System”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO21, pp. 259-262. |
|
C. Vicario et al., “Photocathode Laser Wavelength-tuning for Thermal Emittance and Quantum Efficiency Studies”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO86, pp. 434-437. |
|
M. Calvi et al., “General Strategy for the Commissioning of the ARAMIS Undulators with a 3 GeV Electron Beam”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP040, pp. 107-110. |
|
E. Prat et al., “Thermal Emittance Measurements at the SwissFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THC02, pp. 970-975. |
|
J. Bossert, R. Ganter, M. Schaer, and T. Schietinger, “Cu and Cs2Te Cathodes Preparation and QE History at the SwissFEL Injector Test Facility.”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP046, pp. 832-835. |
|
P. Craievich et al., “High Power RF Test and Analysis of Dark Current in the SwissFEL-gun”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP049, pp. 843-846. |
