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T. Schietinger et al., “Progress Report on the SwissFEL Injector Test Facility”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP065, pp. 1747-1749. |
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T. Schietinger, “Beam Commissioning Plan for the SwissFEL Hard-X-Ray Facility”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 69-73. |
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T. Schietinger, “H5PartRoot - A Visualization And Post-Processing Tool For Accelerator Simulations”, in Proc. 10th Int. Computational Accelerator Physics Conf. (ICAP'09), San Francisco, CA, USA, Aug.-Sep. 2009, paper THPSC049, pp. 343-346. |
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T. Schietinger, “Status and Perspectives for the Swiss Free-Electron Laser (SwissFEL)”, in Proc. 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper MO3A2, pp. 26-31. |
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T. Schietinger, “Towards Full Performance Operation of SwissFEL”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 24-28. |
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T. Schietinger, “Update on the Commissioning Effort at the SwissFEL Injector Test Facility”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper TUPB013, pp. 504-506. |
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T. Schietinger, R. Ischebeck, and B. Beutner, “Phase Space Analysis at the SwissFEL Injector Test Facility”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper TUP102, pp. 653-655. |
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T. Schmidt et al., “Experience with Short-Period, Small Gap Undulators at the SwissFEL Aramis Beamline”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 564-568. |
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Y. Kim et al., “Low Thermal Emittance Measurements at the PSI-XFEL Low Emittance Gun Test Facility”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOPPH055, pp. 110-113. |
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Y. Kim et al., “Measurements and Modeling at the PSI-XFEL 500 kV Low-Emittance Electron Source”, in Proc. 24th Linear Accelerator Conf. (LINAC'08), Victoria, Canada, Sep.-Oct. 2008, paper TUP097, pp. 630-632. |
