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Author: C. Gough


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Reference
A. Adelmann et al., “Towards a Low Emittance X-ray FEL at PSI”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper TUBAU04, pp. 224-227.
A. Streun et al., “Commissioning of the Swiss Light Source”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper TOPA003, pp. 224-226.
C. Gough and M. Mailand, “Septum and Kicker Systems for the SLS”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper FPAH032, pp. 3741-3743.
C. Gough et al., “The SLS Booster Synchrotron”, in Proc. 6th European Particle Accelerator Conf. (EPAC'98), Stockholm, Sweden, Jun. 1998, paper MOP26G, pp. 584-586.
F. Le Pimpec, R. Ganter, C. Gough, C. P. Hauri, and M. Paraliev, “Comparison of High Gradient Achievement for Different Metals in DC and Pulsed DC Mode”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH001, pp. 227-230.
J.-Y. Raguin et al., “Progress in the Design of a Two-Frequency RF Cavity for an Ultra-Low Emittance Pre-Accelerated Beam”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper MOPCH042, pp. 133-135.
K. S. B. Li et al., “Low Emittance X-FEL Development”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP016, pp. XX-XX.
M. Pedrozzi et al., “First Measurement Results of the PSI 500kV Low Emittance Electron Source”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper MOPC045, pp. 169-171.
R. Ganter et al., “Peak Current Performances from Electron Sources based on Field Emission (Single Tip and Field Emitter Arrays (FEAs))”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THCAU04, pp. 781-784.
R. Ganter et al., “Preliminary Results on a Low Emittance Gun Based on Field Emission”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper MOPKF005, pp. 306-308.


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