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Author: A. Oppelt


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Reference
L. Staykov et al., “Commissioning of a New Emittance Measurement System at PITZ”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper TUPPH067, pp. 474-476.
G. Asova et al., “Measurements of the Projected Normalized Transverse Emittance at PITZ”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper MOPPH055, pp. 138-141.
A. Adelmann et al., “Towards a Low Emittance X-ray FEL at PSI”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper TUBAU04, pp. 224-227.
G. Asova et al., “Status and Perspectives of the PITZ Facility Upgrade”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper WEPPH013, pp. 354-357.
G. Asova et al., “Test of a Wiresanner in the Diagnostic Section of PITZ”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper WEPPH049, pp. 461-463.
Y. Chen et al., “Space-Charge Dominated Photoemission in High Gradient Photocathode RF Guns”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 941-944.
R. Niemczyk et al., “Proof-of-Principle Tests for Slit-scan-based Slice Emittance Measurements at PITZ”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 553-556.
J. R. R?Ânsch et al., “Measurement of the Longitudinal Phase Space at the Photo Injector Test Facility at DESY in Zeuthen (PITZ)”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper POM016, pp. XX-XX.
F. Stephan et al., “First Measurements at the Photo Injector Test Facility at DESY Zeuthen”, in Proc. 8th European Particle Accelerator Conf. (EPAC'02), Paris, France, Jun. 2002, paper TUPRI063, pp. 1813-1815.
J. H. Han et al., “Conditioning and High Power Test of the RF Guns at PITZ”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper MOPKF026, pp. 357-359.


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