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Author: A. Oppelt


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Reference
M. Krasilnikov et al., “Characterization of a single-pass high-gain THz FEL at PITZ”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPG68, this conference.
M. Krasilnikov et al., “Electron Beam Asymmetry Compensation with Gun Quadrupoles at PITZ”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 429-431.
M. Krasilnikov et al., “Experimental Characterization of the Electron Source at the Photo Injector Test Facity at DESY Zeuthen”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper WPAB034, pp. 2114-2116.
M. Krasilnikov et al., “High Brightness Photo Injector Upgrade and Experimental Optimization at PITZ”, in Proc. 2nd Int. Particle Accelerator Conf. (IPAC'11), San Sebastian, Spain, Sep. 2011, paper THPC114, pp. 3152-3154.
M. Krasilnikov et al., “Investigations on Electron Beam Imperfections at PITZ”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 165-167.
M. Krasilnikov et al., “Optimizing the PITZ Electron Source for the VUV-FEL”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper MOPKF027, pp. 360-362.
M. Krasilnikov et al., “PITZ Experience on the Experimental Optimization of the RF Photo Injector for the European XFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUOANO04, pp. 160-168.
M. Krasilnikov et al., “PITZ Experimental Optimization for the Aimed Cathode Gradient of a Superconducting CW RF Gun”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 440-443.
M. Krasilnikov et al., “PITZ Status, Recent Measurements and Tests”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD59, pp. 181-184.
M. Krasilnikov et al., “Recent Developments at PITZ”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP006, pp. 1012-1014.


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