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Author: M. Pedrozzi


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Reference
Y. Kim et al., “Low Thermal Emittance Measurements at the PSI-XFEL Low Emittance Gun Test Facility”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOPPH055, pp. 110-113.
S. Reiche, R. Abela, H.-H. Braun, B. Patterson, and M. Pedrozzi, “Seeding Option for the Soft X-ray Beamline of SwissFEL”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC05, pp. 51-54.
S. Reiche, R. Abela, B. Beutner, H.-H. Braun, B. Patterson, and M. Pedrozzi, “Proposed Extension to the 250 MeV Injector Beamline at PSI for Testing Seeding Options at the SwissFEL”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC06, pp. 55-58.
S. Reiche, H.-H. Braun, Y. Kim, and M. Pedrozzi, “Low Charge Operation of SwissFEL”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC07, pp. 59-62.
R. Ganter et al., “Commissioning of a Diode / RF Photogun Combination”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper TUPC35, pp. 317-320.
M. Pedrozzi and Y. Kim, “250 MeV Injector Test Facility for the SwissFEL Project”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper TUPC38, pp. 321-324.
M. Pedrozzi et al., “SwissFEL Injector Test Facility ÔÇô Test and Plans”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB30, pp. 625-628.
C. Vicario et al., “Timing Jitter Measurements of the SwissFEL Test Injector”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper MOPSO77, pp. 140-143.
S. Bettoni, P. Craievich, M. Pedrozzi, S. Reiche, and L. Stingelin, “Dark Current Transport and Collimation Studies for SwissFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO03, pp. 209-213.
S. Bettoni, P. Craievich, M. Pedrozzi, and S. Reiche, “Simulations of a Corrugated Beam Pipe for the Chirp Compensation in SwissFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO04, pp. 214-218.


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