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Author: V. Schlott


References



Reference
N. Hiller et al., “Single-Shot Electro-Optical Diagnostics at the ANKA Storage Ring”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD17, pp. 182-186.
R. Ischebeck et al., “Overview of Beam Instrumentation Activities for SwissFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF31, pp. 119-123.
R. Ischebeck et al., “SwissFEL Beam Profile Monitor”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUCYB3, pp. 259-262.
V. Schlott, “Overview and Status of SwissFEL Diagnostics”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 12-16.
M. M. Dehler et al., “Design Concept for a THz Driven Streak Camera With Ultra High Resolution”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 156-160.
P. Pollet, R. Ischebeck, D. Llorente Sancho, G. Marinkovic, C. Ozkan Loch, and V. Schlott, “System Integration of SwissFEL Beam Loss Monitors”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 170-174.
G. L. Orlandi, R. Ischebeck, C. Ozkan Loch, V. Schlott, M. Ferianis, and G. Penco, “Design and Experimental Tests of the SwissFEL Wire-Scanners”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 225-228.
P. N. Juranic et al., “PALM Concepts and Considerations”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 848-851.
M. Yan et al., “Design of a Time-resolved Electron Diagnostics Using THz Fields Excited in a Split Ring Resonator at FLUTE”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 475-478.
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.


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