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Author: J. H. Han


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Reference
L. Monaco et al., “Dark Current Investigation of TTF and PITZ RF Guns”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper WEPLS051, pp. 2493-2495.
D. Sertore, J. H. Han, P. Michelato, L. Monaco, C. Pagani, and S. Schreiber, “High QE Photocathode at FLASH”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper WEPLS052, pp. 2496-2498.
J. W. Baehr et al., “Upgrades of the Laser Beam-line at PITZ”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP034, pp. XX-XX.
J. R. Roensch et al., “Longitudinal Phase Space Studies at PITZ”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP040, pp. XX-XX.
V. Miltchev et al., “Measurements of Thermal Emittance for Cesium Telluride Photocathodes at PITZ”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP042, pp. XX-XX.
A. Oppelt et al., “Status and First Results from the Upgraded PITZ Facility”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP043, pp. XX-XX.
M. Krasilnikov et al., “Experimental Characterization of the Electron Source at the Photo Injector Test Facity at DESY Zeuthen”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper WPAB034, pp. 2114-2116.
D. Sertore, A. Bonucci, J. H. Han, P. Michelato, L. Monaco, and S. Schreiber, “Review of the Production Process of TTF and PITZ Photocathodes”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper MOPB009, pp. 671-673.
J. H. Han et al., “Emission Mechanisms in a Photocathode RF Gun”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP003, pp. 856-858.
J. H. Han et al., “Dark Current and Multipacting in the Photocathode RF Guns at PITZ”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP004, pp. 895-897.


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