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W. Blokland, “A Lab VIEW-based Accelerator Instrumenation Platform”, in Proc. 4th European Particle Accelerator Conf. (EPAC'94), London, UK, Jun.-Jul. 1994, pp. 1527-1530. |
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W. Blokland, “A VX1/LabVIEW-Based Beamline Tuner”, in Proc. 15th Particle Accelerator Conf. (PAC'93), Washington D.C., USA, Mar. 1993, pp. 2528-2531. |
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W. Blokland, “Experience with and Studies of the SNS Target Imaging System”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPD13, pp. 447-451. |
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W. Blokland, “High Beam Intensity Harp Studies and Developments at SNS”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 17-20. |
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W. Blokland, “Machine learning for improved accelerator and target reliability”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper THXD1, this conference. |
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W. Blokland, “Non-invasive Beam Profile Measurements using an Electron-Beam Scanner”, in Proc. 46th ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'10), Morschach, Switzerland, Sep.-Oct. 2010, paper WEO2A03, pp. 438-442. |
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W. Blokland, “Recent Developments on High Intensity Beam Diagnostics at SNS”, in Proc. 52nd ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'12), Beijing, China, Sep. 2012, paper TUO1C01, pp. 292-296. |
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W. Blokland, A. V. Aleksandrov, S. M. Cousineau, D. A. Malyutin, and A. A. Starostenko, “Electron Scanner for SNS Ring Profile Measurements”, in Proc. 9th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'09), Basel, Switzerland, May 2009, paper TUOA03, pp. 155-157. |
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W. Blokland, A. V. Liyu, C. D. Long, D. J. Murphy, J. D. Purcell, and M. Sundaram, “Dynamic Visualization of SNS Diagnostics Summary Report and System Status”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper FPAT014, pp. 1395-1397. |
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W. Blokland, C. C. Peters, and T. B. Southern, “Enhancements to the SNS* Differential Current Monitor to Minimize Errant Beam”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 146-149. |
