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Author: F. Sannibale


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Reference
C. F. Papadopoulos et al., “Injector Optimization for a High-repetition Rate X-ray FEL”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD31, pp. 89-92.
D. Filippetto et al., “APEX Initial Commissioning Results”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper WEOAI01, pp. 337-344.
J. N. Corlett et al., “Design Concepts for a Next Generation Light Source at LBNL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUOCNO05, pp. 193-199.
J. N. Corlett et al., “Superconducting Linac Design Concepts for a Next Generation Light Source at LBNL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO13, pp. 229-235.
S. De Santis et al., “Beam Diagnostic Requirements for the Next Generation Light Source”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO15, pp. 242-244.
D. Filippetto, L. R. Doolittle, G. Huang, G. Marcus, H. J. Qian, and F. Sannibale, “The Photocathode Laser System for the APEX High Repetition Rate Photoinjector”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO19, pp. 255-258.
C. F. Papadopoulos et al., “Injector Design Studies for NGLS”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO69, pp. 391-394.
C. Steier et al., “Design of a Collimation System for the Next Generation Light Source at LBNL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO78, pp. 410-412.
C. E. Mitchell et al., “Higher-Order Moment Models of Longitudinal Pulse Shape Evolution in Photoinjectors”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP019, pp. 722-725.
J. F. Schmerge et al., “The LCLS-II Injector Design”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP042, pp. 815-819.


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