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Author: V. Balandin


References



Reference
A. Cianchi et al., “Non-intercepting Emittance Measurements by means of Optical Diffraction Radiation Interference for High Brightness Electron Beam”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPR024, pp. 831-833.
A. Cianchi et al., “Optical Diffraction Radiation Interference as a Non-intercepting Emittance Measurement for High Brightness and High Repetition Rate Electron Beam”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper WEOB02, pp. 353-356.
B. Faatz et al., “FLASH II: A Project Update”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA22, pp. 247-250.
B. Faatz et al., “FLASH II: a Seeded Future at FLASH”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE005, pp. 2152-2154.
B. Keil et al., “Design Status of the European X-FEL Tranverse Intra Bunch Train Feedback”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA35, pp. 133-137.
E. Prat, V. Balandin, N. Golubeva, J. K. Kamenik, I. Kriznar, and T. Kusterle, “Orbit and Dispersion Tool at FLASH”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPP017, pp. 1565-1567.
E. Schneidmiller et al., “Considerations for the Ultrahard X-ray Undulator Line of the European XFEL”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 1732-1735.
E. Schneidmiller et al., “Feasibility Studies of the 100 keV Undulator Line of the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 172-175.
K. Honkavaara et al., “Status of the FLASH II Project”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper WEPD07, pp. 381-384.
L. Fr?Âhlich et al., “Multi-Beamline Operation at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 335-338.


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