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Author: C. Gerth


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Reference
M. Roehrs, C. Gerth, M. Huening, and H. Schlarb, “Slice Emittance Measurements at FLASH”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper MOPCH013, pp. 77-79.
M. V. Lalayan et al., “Layout of the PITZ Transverse Deflecting System for Longitudinal Phase Space and Slice Emittance Measurements”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper TUP011, pp. 416-418.
M. Viti et al., “Recent Upgrades of the Bunch Arrival Time Monitors at FLASH and European XFEL”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 695-698.
M. Viti et al., “The Bunch Arrival Time Monitor at FLASH and European XFEL”, in Proc. 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17), Barcelona, Spain, Oct. 2017, pp. 701-705.
M. Vogt et al., “Status of the Superconducting Soft X-Ray Free-Electron Laser User Facility FLASH”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1006-1009.
M. Vogt et al., “The FLASH 2020+ Upgrade Project”, presented at the 21th Int. Conf. RF Superconductivity (SRF'23), Grand Rapids, MI, USA, Jun. 2023, paper TUIAA02, unpublished.
M. W. Poole et al., “4GLS - a New Type of Fourth Generation Light Source Facility”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper TOAC004, pp. 189-191.
M. Yan and C. Gerth, “Single-bunch Longitudinal Phase Space Diagnostics in Multi-bunch Mode at the European XFEL”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPME012, pp. 494-496.
M. Yan et al., “First Realization and Performance Study of a Single-Shot Longitudinal Bunch Profile Monitor Utilizing a Transverse Deflecting Structure”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC36, pp. 456-459.
M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944.


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