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Author: H.-J. Grabosch


References



Reference
S. Rimjaem et al., “Tuning and Conditioning of a New High Gradient Gun Cavity at PITZ”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper MOPC078, pp. 244-246.
C. H. Boulware et al., “Latest Results at the Upgraded PITZ Facility”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper THAAU05, pp. 481-484.
J. Roensch et al., “First Measurement Results from the Upgraded Low Energy Longgitudinal Phase Space Diagnostics at PITZ”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH038, pp. 330-333.
S. Rimjaem et al., “Recent Emittance Measurement Results for the Upgraded PITZ Facility”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper TUPC09, pp. 251-254.
G. Asova et al., “Phase Space Measurements with Tomographic Reconstruction at PITZ”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEOC4, pp. 529-532.
M. A. Khojoyan et al., “Measurement and Simulation Studies of Emittance for Short Gaussian Pulses at PITZ”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB06, pp. 402-405.
S. Rimjaem et al., “Measurements and Simulations of Emittance for Different Bunch Charges at PITZ”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB09, pp. 410-413.
S. Rimjaem et al., “Emittance for Different Bunch Charges at the Upgraded PITZ Facility”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA06, pp. 473-476.
M. Krasilnikov et al., “An Option of High Charge Operation for the European XFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA08, pp. 481-484.
I. I. Isaev et al., “RF Photo Gun Stability Measurement at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA10, pp. 485-488.


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