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Author: B. Keil


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Reference
R. Ischebeck et al., “Instrumentation and Results from the SwissFEL Injector Test Facility”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOBL1, pp. 12-18.
R. Ischebeck et al., “Overview of Beam Instrumentation Activities for SwissFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF31, pp. 119-123.
T. Schilcher et al., “First Steps towards the Integration of Photon Beam Position Monitor Signals into the SLS Fast Orbit Feedback”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper POW015, pp. XX-XX.
T. Schilcher, M. B?Âge, B. Keil, P. Pollet, and V. Schlott, “Commissioning and Operation of the SLS Fast Orbit Feedback”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper THPLT024, pp. 2523-2525.
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.
V. Schlott et al., “Intra Bunch Train Feedback System for the European X-FEL”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPCH096, pp. 3017-3019.
W. Koprek et al., “Development of New BPM Electronics for the Swiss Light Source”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA26, pp. 399-403.
W. Koprek, B. Keil, and G. Marinkovic, “Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 165-169.
Y. Kim et al., “Beam Diagnostics and RF Systems Requirements for the SwissFEL Facility”, in Proc. 9th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'09), Basel, Switzerland, May 2009, paper WEOB01, pp. 427-429.


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