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Author: S. Reiche


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Reference
B. Beutner and S. Reiche, “Sensitivity and Tolerance Study for the SwissFEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB17, pp. 437-440.
R. Ischebeck et al., “Response Matrix of Longitudinal Instrumentation in SwissFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper FROA4, pp. 652-655.
M. Pedrozzi et al., “SwissFEL Injector Test Facility ÔÇô Test and Plans”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB30, pp. 625-628.
W. M. Fawley et al., “Toward TW-level, Hard X-ray Pulses at LCLS”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUOA4, pp. 160-163.
S. Reiche, “Status of the SwissFEL Facility at the Paul Scherrer Institute”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA15, pp. 223-226.
B. Beutner and S. Reiche, “Operation Modes and Longitudinal Layout for the SwissFEL Hard X-Ray Facility”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA19, pp. 235-238.
E. Prat and S. Reiche, “EEHG Seeding Design for SwissFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA25, pp. 251-254.
S. Reiche and E. Prat, “Growth Rates and Coherence Properties of FODO-lattice based X-ray Free Electron Lasers”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOOC02, pp. 25-28.
S. Reiche and M. Carl?á, “Detailed Modeling of Seeded Free-electron Lasers”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD35, pp. 101-104.
F. Le Pimpec, A. Adelmann, S. Reiche, R. Zennaro, and B. Grigoryan, “Dark Current Studies for SwissFEL”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD36, pp. 105-108.


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