JaCoW Logo

Reference Search

Author: Y. Zhang


References



Reference
J. A. Holmes et al., “Computational Beam Dynamics for SNS Commissioning and Operation”, in Proc. 9th Int. Computational Accelerator Physics Conf. (ICAP'06), Chamonix, Switzerland, Oct. 2006, paper MOMPMP01, pp. XX-XX.
Y. Zhang, “Experience and Lessons with the SNS Superconducting Linac”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOZMH01, pp. 26-30.
J. G. Wang and Y. Zhang, “Magnet Optical and Beam Matching Issues in a Medium Energy Beam Transport line of SNS Linac”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPE051, pp. 4632-4634.
V. G. Dudnikov, Y. S. Derbenev, R. P. Johnson, and Y. Zhang, “Highly Polarized Ion Sources for Electron Ion Colliders (EIC)”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPEC071, pp. 4220-4222.
Q. Qin et al., “Beam Dynamic Issues in the BEPCII Luminosity Commissioning”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPEB020, pp. 1560-1562.
B. Terzic and Y. Zhang, “Numerical Simulation of Beam-beam Effects in the Proposed Electron-ion Collider at Jefferson Lab”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPEC083, pp. 1910-1912.
J. Popielarski et al., “FRIB Technology Demonstration Cryomodule Test”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB090, pp. 386-388.
J. Popielarski et al., “FRIB Technology Demonstration Cryomodule Test”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPLB10, pp. 165-167.
J. Wei et al., “FRIB Accelerator Status and Challenges”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper TU1A04, pp. 417-421.
M. Leitner et al., “Status of the Linac SRF Acquisition for FRIB”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper TUPB040, pp. 564-566.


Back to the list