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Author: D. P. Griffis


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Reference
P. Maheshwari et al., “SIMS and TEM Analysis of Niobium Bicrystals”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO028, pp. 776-780.
F. A. Stevie, D. P. Griffis, Z. Zhu, G. R. Myneni, and P. Kneisel, “Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper TUP56, pp. 379-381.


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