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Author: J. Hock


References



Reference
X. Gu et al., “A Split-Electrode for Clearing Scattered Electrons in the RHIC E-Lens”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPR032, pp. 4038-4040.
W. Fischer et al., “Construction Progress of the RHIC Electron Lenses”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEOBA01, pp. 2125-2127.
X. Gu et al., “The E-Lens Test Bench for Rhic Beam-Beam Compensation”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEPPD084, pp. 2720-2722.
W. Fischer et al., “Commissioning Progress of the RHIC Electron Lenses”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper TUPFI077, pp. 1526-1528.
W. Fischer et al., “First Experience with Electron Lenses for Beam-beam Compensation in RHIC”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 913-917.
X. Gu et al., “RHIC Electron Lenses Upgrades”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 3830-3832.
V. H. Ranjbar et al., “RHIC Polarized Proton Operation for 2017”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 2188-2190.
P. Thieberger et al., “The Electron Backscattering Detector (eBSD), a New Tool for the Precise Mutual Alignment of the Electron and Ion Beams in Electron Lenses”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD02, pp. 129-133.
S. Seletskiy et al., “Conceptual Design of LEReC Fast Machine Protection System”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 665-668.
S. Seletskiy et al., “Status of the LEReC Machine Protection System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 487-490.


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