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Author: Y. Seimiya


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Reference
Y. Funakoshi et al., “The SuperKEKB Has Broken the World Record of the Luminosity”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1-5.
Y. Ohnishi et al., “Commissioning of the Phase-I SuperKEKB B-Factory and Update on the Overall Status”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 32-36.
Y. Seimiya and K. Ohmi, “Synchro-beta Resonance Simulation using Measured Chromatic Aberrations”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPE070, pp. 4680-4682.
Y. Seimiya et al., “An Optimization of ILC Positron Source for Electron-Driven Scheme”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 2529-2531.
Y. Seimiya et al., “CsKSb Photocathode R&D with High Quantum Efficiency and Long Lifetime”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 2526-2528.
Y. Seimiya et al., “Electron-Driven Positron Capture Simulation for ILC”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper MOPP077, pp. 233-235.
Y. Seimiya et al., “Emittance Growth by Misalignments and Jitters in SuperKEKB Injector Linac”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 3871-3873.
Y. Seimiya, H. Koiso, and K. Ohmi, “Symplectic Expression for Chromaticity”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TH6PFP080, pp. 3892-3894.
Y. Seimiya, K. Furukawa, T. Higo, F. Miyahara, M. Satoh, and T. Suwada, “Investigation of Beam Variation and Emittance Growth Simulation With Both Misalignments and the Beam Jitter for SuperKEKB Injector Linac”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 1304-1307.
Y. Seimiya, M. Kuriki, and N. Yamamoto, “Multi-alkali Photocathode R&D”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 661-663.


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