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Author: F. Becker


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Reference
F. Becker et al., “Beam Induced Fluorescence Monitors for FAIR”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPR012, pp. 798-800.
P. J. Spiller et al., “The Accelerator Facility of the Facility for Antiproton and Ion Research”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1343-1345.
F. Becker et al., “Establishing a Project Management Office for the Large Scale Multi Project FAIR”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 835-838.
S. Deveaux and F. Becker, “FAIR Risk Management as a Proactive Steering Tool for the Large Scale Multi Project”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 839-841.
N. Winters, F. Becker, and M. V. Ricciardi, “Integrated Project Planning as a Central Steering Tool for the Large Scale Multi Project FAIR”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 842-844.
M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.
F. Becker, F. M. Bieniosek, P. Forck, D. H. H. Hoffmann, and P. N. Ni, “Beam Induced Fluorescence (BIF) Monitor for Intense Heavy Ion Beams”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF054, pp. 236-240.
F. Becker et al., “Beam Induced Fluorescence MonitorÔÇôSpectroscopy in Nitrogen, Helium, Argon, Krypton, and Xenon Gas”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM020, pp. 156-159.
B. Walasek-Hoehne et al., “Pilot Studies on Optical Transition Radiation Imaging of Non-relativistic Ions at GSI”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper TUCP03, pp. 130-132.
K. Renuka et al., “Transverse Beam Profile Monitoring using Scintillation Screens for High Energy Ion Beams”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper TUPG022, pp. 183-185.


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