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Author: R. Haseitl


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Reference
F. Becker et al., “Beam Induced Fluorescence Monitors for FAIR”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPR012, pp. 798-800.
P. Forck et al., “Beam-based Tests of Intercepting Transverse Profile Diagnostics for FAIR”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 3480-3482.
A. Reiter et al., “Beam Instrumentation for CRYRING@ESR”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2084-2087.
R. Singh et al., “Understanding the Tune Spectrum of High Intensity Beams”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper THAL1, pp. 914-920.
C. Andre, P. Forck, R. Haseitl, A. Reiter, R. Singh, and B. Walasek-Hoehne, “Optimization of Beam Induced Fluorescence Monitors for Profile Measurements of High Current Heavy Ion Beams at GSI”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPD05, pp. 412-416.
B. Walasek-Hoehne et al., “CUPID: New System for Scintillating Screen Based Diagnostics”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPD06, pp. 417-420.
P. Forck, E. Guetlich, R. Haseitl, and P. Kowina, “Scintillation Screen Investigations for High Current Ion Beams at GSI Linac”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF008, pp. 100-104.
B. Walasek-H?Âhne, W. Ensinger, P. Forck, E. Guetlich, and R. Haseitl, “Light Yield, Imaging Properties and Spectral Response of Inorganic Scintillators Under Intense Ion Irradiation”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM019, pp. 151-155.
F. Becker et al., “Beam Induced Fluorescence MonitorÔÇôSpectroscopy in Nitrogen, Helium, Argon, Krypton, and Xenon Gas”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM020, pp. 156-159.
K. Renuka et al., “Transverse Beam Profile Monitoring using Scintillation Screens for High Energy Ion Beams”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper TUPG022, pp. 183-185.


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