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D. Khan and T. O. Raubenheimer, “Cancellation of Coherent Synchrotron Radiation Kicks at LCLS”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 296-299. |
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D. Khan and T. O. Raubenheimer, “Approximated Expressions for the Coherent Synchrotron Radiation Effect in Bending Magnets”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 300-304. |
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D. Khan and T. O. Raubenheimer, “An Emittance-Preservation Study of a Five-Bend Chicane for the LCLS-II-HE Beamline”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 305-308. |
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G. Zhou et al., “Measurement of Short-Wavelength High-Gain FEL Temporal Coherence Length by a Phase Shifter”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 344-347. |
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J. Wu et al., “Slippage-Enhanced SASE FEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 348-351. |
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G. R. White and T. O. Raubenheimer, “Tolerances for Plasma Wakefield Acceleration Drivers”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 614-617. |
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D. Gonnella et al., “The LCLS-II HE High Q and Gradient R&D Program”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 154-158. |
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G. Marcus et al., “Regenerative Amplification for a Hard X-Ray Free-Electron Laser”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 118-121. |
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G. Marcus et al., “Cavity-Based Free-Electron Laser Research and Development: A Joint Argonne National Laboratory and SLAC National Laboratory Collaboration”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 282-287. |
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Z. Zhang, C. Adolphsen, Y. Ding, and T. O. Raubenheimer, “Multi-Energy Operation Analysis in a Superconducting Linac Based on off-Frequency Detune Method”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 416-419. |