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Z. Y. Guo et al., “Experiment to Measure the Electron Cloud at BEPC”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper FOAB003, pp. 676-678. |
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Z. T. Zhao et al., “Design of a Copper Cavity for HLS”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper MPPH308, pp. 1201-1203. |
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H. Gang and Z. T. Zhao, “Simulation Code of Beam Instability with Object Oriented Technology”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper RPAH315, pp. 3206-3208. |
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H. Gang, T. Dechun, H. Wenhui, and Z. T. Zhao, “Longitudinal Broadband Impedance Measurement System by Coaxial Line Methods”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper TPPH312, pp. 2060-2062. |
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Z. T. Zhao, S. Y. Chen, and H. J. Xu, “Current Status of the SSRF Project”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper WPPH328, pp. 2827-2829. |
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J. P. Dai, X. D. Chai, and Z. T. Zhao, “HOMs Effects in the BEPC DC Separator”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper TUA160, pp. 1453-1455. |
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S. Y. Chen, H. J. Xu, Z. T. Zhao, and P. R. China, “Shanghai Synchrotron Radiation Facility”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper TUDL1, pp. 209-211. |
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Z. Qi, C. Feng, B. Liu, W. Y. Zhang, and Z. T. Zhao, “Two-Color Soft X-Ray Generation at the SXFEL User Facility Based on the EEHG Scheme”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 84-86. |
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K. Q. Zhang, C. Feng, D. Wang, and Z. T. Zhao, “Simulation and Optimization for Soft X-Ray Self-Seeding at SXFEL User Facility”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 87-90. |
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Z. Zhu, Z. T. Zhao, D. Wang, Z. H. Yang, and L. Yin, “SCLF: An 8-GeV CW SCRF Linac-Based X-Ray FEL Facility in Shanghai”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 182-184. |
