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Author: C. E. Clayton


References



Reference
R. Ischebeck et al., “Bunch Length Measurements Using Coherent Radiation”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper RPAT078, pp. 4027-4029.
R. Ischebeck et al., “Resolution of Transverse Electron Beam Measurements Using Optical Transition Radiation”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper RPAT079, pp. 4042-4044.
M. J. Hogan et al., “Review of Beam-Driven Plasma Wakefield Experiments at SLAC”, presented at the 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TOPA002, unpublished.
P. Musumeci et al., “High Energy Gain IFEL at UCLA Neptune Laboratory”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TOPA006, pp. 500-504.
C. D. Barnes et al., “Determination of Longitudinal Phase Space in SLAC Main Accelerator Beams”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE024, pp. 1856-1858.
C. L. O et al., “Field Ionization of Neutral Lithium Vapor using a 28.5 GeV Electron Beam”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE025, pp. 1904-1906.
C. Huang et al., “Modeling TeV Class Plasma Afterburners”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE041, pp. 2666-2668.
K. A. Marsh et al., “Beam Matching to a Plasma Wake Field Accelerator Using a Ramped Density Profile at the Plasma Boundary”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE042, pp. 2702-2704.
C. Sung et al., “Terahertz IFEL/FEL Microbunching for Plasma Beatwave Accelerators”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE044, pp. 2812-2814.
M. Zhou et al., “Modeling Self-Ionized Plasma Wakefield Acceleration for Afterburner Parameters Using QuickPIC”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE046, pp. 2905-2907.


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