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Author: S. Gammino


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Reference
S. Gammino, “SUPERCONDUCTING ECR ION SOURCES: HIGH INTENSITY BEAMS EXTRACTION AND TRANSPORT”, in Proc. 17th Int. Conf. on Cyclotrons and Their Applications (Cyclotrons'04), Tokyo, Japan, Oct. 2004, paper 19A2, pp. XX-XX.
S. Gammino, L. Celona, G. Ciavola, and D. Mascali, “New Tools for the Improvement of Beam Brightness in ECR Ion Sources”, in Proc. 19th Int. Conf. on Cyclotrons and their Applications (Cyclotrons'10), Lanzhou, China, Sep. 2010, paper WEM1CIO03, pp. 327-331.
S. Gammino, L. Celona, G. Ciavola, F. Maimone, and D. Mascali, “The MISHA Ion Source for Hadron Therapy Facilities”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper MO6RFP030, pp. 417-419.
S. Marletta, E. G. Messina, L. Celona, F. Chines, G. Ciavola, and S. Gammino, “Ionization Efficiency Measurements with The Microwave Discharge Ion Source MIDAS”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper THP6B06, pp. 1601-1603.
S. Peggs et al., “The European Spallation Source”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper FROAN1, pp. 2549-2551.
S. T. Salvatore et al., “Time Resolved X-Ray Measurements in a Simple Mirror Trap”, in Proc. 23th International Workshop on ECR Ion Sources (ECRIS'18), Catania, Italy, Sep. 2018, pp. 162-164.
V. A. Toivanen et al., “Effects of Microwave Frequency Fine Tuning on the Performance of JYFL 14 GHz ECRIS”, in Proc. 19th Int. Workshop on ECR Ion Sources (ECRIS'10), Grenoble, France, Aug. 2010, paper TUPOT010, pp. 137-139.
V. A. Toivanen et al., “Studies of ECRIS Ion Beam Formation and Quality at the Department of Physics, University of Jyv?ñskyl?ñ”, in Proc. 19th Int. Conf. on Cyclotrons and their Applications (Cyclotrons'10), Lanzhou, China, Sep. 2010, paper MOPCP050, pp. 153-155.
W. Wittmer et al., “European Spallation Source (ESS) Normal Conducting Front End Status Report”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 274-276.


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