|
M. K. Bock et al., “Beam Arrival Time Monitors Used in a Time-Of-Flight Beam Energy Measurement”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEPC66, pp. 659-662. |
|
K. E. Hacker et al., “Design and Drift Performance of the FLASH Master Laser Oscillator RF-Lock”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEPC69, pp. 663-666. |
|
K. E. Hacker et al., “Demonstration of a BPM with 5 Micron Resolution over a 10cm Range”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEPC70, pp. 667-670. |
|
S. Schulz et al., “Progress Towards a Permanent Optical Synchronization Infrastructure at FLASH”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEPC72, pp. 671-674. |
|
M. Felber et al., “RF-based Synchronization of the Seed and Pump-Probe Lasers to the Optical Synchronization System at FLASH”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THOA3, pp. 544-547. |
|
P. Gessler et al., “Longitudinal Bunch Arrival-Time Feedback at FLASH”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THPA04, pp. 578-580. |
|
S. Schulz et al., “Performance of the FLASH Optical Synchronization System Utilizing a Commercial SESAM-Based Erbium Laser”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THPA05, pp. 581-584. |
|
P. Gessler et al., “Real-Time Sampling and Processing Hardware for Bunch Arrival-Time Monitors at FLASH and XFEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THPA06, pp. 585-587. |
|
K. E. Hacker et al., “Echo Seeding Experiment at FLASH”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPB10, pp. 279-282. |
|
K. E. Hacker et al., “Progress Towards HGHG and EEHG at FLASH”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper TUPD13, pp. 257-260. |
