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Author: C. A. Thomas


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Reference
A. F. D. Morgan, C. A. Thomas, and R. Bartolini, “Storage Ring Injector Diagnostics using Synchrotron Radiation”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper MOPD62, pp. 191-193.
A. G. Sosa et al., “Status of Testing and Commissioning of the Medium Energy Beam Transport Line of the ESS Normal Conducting Linac”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 376-379.
C. A. Thomas and G. Rehm, “An X-ray Pinhole Camera System for Diamond”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper POM026, pp. XX-XX.
C. A. Thomas and G. Rehm, “Diamond Optical Diagnostics: First Streak Camera Measurements”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper TUPCH047, pp. 1112-1114.
C. A. Thomas and G. Rehm, “Fast Pinhole Camera for Optimisation of Top Up Injection”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF068, pp. 279-281.
C. A. Thomas and G. Rehm, “Pinhole Camera Resolution and Emittance Measurement”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPC086, pp. 1254-1256.
C. A. Thomas and G. Rehm, “Time Domain Measurements at Diamond”, in Proc. 8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'07), Venice, Italy, May 2007, paper WEPB25, pp. 289-291.
C. A. Thomas et al., “Commissioning of the Non-invasive Profile Monitors for the ESS LEBT”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 495-498.
C. A. Thomas et al., “Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 551-554.
C. A. Thomas et al., “Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 455-458.


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