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Author: U. Lehnert


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Reference
U. Lehnert, V. B. Asgegar, P. Michel, G. Staats, J. Teichert, and R. Wuensch, “Gain Deterioration at Particular Wavelengths in a Partially Waveguided FEL”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOPPH016, pp. 36-38.
U. Schramm et al., “First Results with the Novel Peta-Watt Laser Acceleration Facility in Dresden”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 48-52.
V. B. Asgekar, U. Lehnert, and P. Michel, “A Tapered-Undulator Experiment at the ELBE FIR Oscillator FEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper TUPA03, pp. 212-214.
V. J. Joshi et al., “Design Calculation on Beam Dynamics and THz Radiation of Delhi Light Source”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 153-155.
W. Sch?Âllkopf et al., “First Lasing of the IR FEL at the Fritz-Haber-Institut Berlin”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOOB01, pp. XX-XX.
W. Sch?Âllkopf et al., “Status of the Fritz Haber Institute THz FEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPB30, pp. 315-317.
W. Sch?Âllkopf et al., “The IR and THz Free Electron Laser at the Fritz-Haber-Institut”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper WEPSO62, pp. 657-660.
W. Sch?Âllkopf et al., “The New IR FEL Facility at the Fritz-Haber-Institut in Berlin”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper WEB04, pp. 629-634.
W. Seidel et al., “A Far-Infrared FEL for the Radiation Source ELBE”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper TUPP031, pp. XX-XX.
W. Seidel et al., “Three Years of CW-Operation at FELBE - Experiences and Applications”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH060, pp. 382-385.


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