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Author: X. Jin


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Reference
J. Xiao et al., “An Ultra-Low Energy Electron Beam Ion Trap in Shanghai”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPFI066, pp. 434-436.
H. B. WANG, X. Jin, M. Li, X. S. Liu, and Z. Xu, “Beam Optics Design for DC High-voltage Accelerator of MW Level”, in Proc. 4th Asian Particle Accelerator Conf. (APAC'07), Indore, India, Jan.-Feb. 2007, paper THPMA126, pp. 818-820.
T. Miyajima et al., “Beam Simulations of High Brightness Photocathode DC Gun and Injector for High Repetition FEL Light Source”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THC04, pp. 980-984.
Z. L. Zhang et al., “Design of a Four-Vane RFQ for China ADS Project”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper THPB039, pp. 942-944.
S. Sakanaka et al., “The First Beam Recirculation and Beam Tuning in the Compact ERL at KEK”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper TUPP075, pp. 599-602.
X. Yang, X. Jin, M. Li, W. Li, and Z. Xu, “The Research of FIR-FEL in CAEP”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper TUPPH028, pp. 386-389.
H. Chen et al., “A New Type SW Linac Used in Industrial CT”, in Proc. 3rd Asian Particle Accelerator Conf. (APAC'04), Gyeongju, Korea, Mar. 2004, paper TUP19002, pp. XX-XX.
M. Li, X. Jin, and Z. Xu, “First Lasing of the CAEP FIR-FEL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOOB005, pp. XX-XX.
L. T. Sun et al., “Status Report on a Low Energy High Intensity High Charge State Heavy Ion Accelerator Facility at Imp”, in Proc. 11th Int. Particle Accelerator Conf. (IPAC'20), Caen, France, May 2020, paper TUVIR13, pp. XX-XX.
M. Kuriki, L. Guo, X. Jin, Z. Liptak, and N. Yamamoto, “GaAs cathode activation with Cs-K-Sb thin film”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPL099, pp. 792-795.


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