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Author: C. F. Papadopoulos


References



Reference
J. F. Schmerge et al., “The LCLS-II Injector Design”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP042, pp. 815-819.
J. N. Corlett et al., “A Next Generation Light Source Facility at LBNL”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper TUOCS5, pp. 775-777.
J. N. Corlett et al., “Design Concepts for a Next Generation Light Source at LBNL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUOCNO05, pp. 193-199.
J. N. Corlett et al., “Design Studies for a Next Generation Light Source Facility at LBNL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper MOPA06, pp. 38-40.
J. N. Corlett et al., “Design Studies for a VUV-Soft X-ray FEL Facility at LBNL”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPEA067, pp. 2639-2641.
J. N. Corlett et al., “Next Generation Light Source R&D and Design Studies at LBNL”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP070, pp. 1762-1764.
J. Qiang et al., “Development of an Advanced Computational Tool for Start-to-End Modeling of Next Generation Light Sources”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUEPPB013, pp. 1143-1145.
J. Qiang et al., “Start-to-end Simulation of a Next Generation Light Source Using the Real Number of Electrons”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper MOPSO66, pp. 112-116.
J. Qiang et al., “Start-to-End Simulation of the LCLS-II Beam Delivery System with Real Number of Electrons”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 714-717.
L. Wang et al., “MOGA OPTIMIZATION DESIGN OF LCLS-II LINAC CONFIGURATIONS”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP029, pp. 763-768.


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