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Author: H.-S. Kang


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Reference
J. H. Hong et al., “Development of Photocathode RF-gun at PAL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO28, pp. 279-281.
J. Kim et al., “Remote RF Synchronization With Femtosecond Drift at PAL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper WEPSO33, pp. 570-573.
Y. W. Parc, J. H. Han, I. Hwang, H.-S. Kang, I. S. Ko, and J. Wu, “Simulation Results of Self-seeding Scheme in PAL-XFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper WEPSO47, pp. 606-608.
S.-H. Jeong et al., “PAL-XFEL Magnet Power Supply System”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP032, pp. 87-89.
H. S. Suh et al., “Design, Fabrication, and Performance Tests of Dipole and Quadrupole Magnets for PAL-XFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP033, pp. 90-92.
J. Kim et al., “Femtosecond-Stability Delivery of Synchronized RF-Signals to the Klystron Gallery over 1-km Optical Fibers”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THB03, pp. 663-665.
J. H. Hong et al., “Beam Measurement of Photocathode RF-gun for PAL-XFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP011, pp. 699-702.
H. Yang, J. H. Han, H.-S. Kang, and I. S. Ko, “Error Analysis for Linac Lattice of Hard X-ray FEL Line in PAL-XFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP012, pp. 703-706.
H.-S. Kang and J. H. Hong, “A Beam Test of Corrugated Structure for Passive Linearizer”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper TUP093, pp. 593-595.
J. H. Han et al., “Beam Operation of the PAL-XFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper WEB02, pp. 615-622.


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