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Author: K. P. Wootton


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Reference
K. P. Wootton et al., “Vertical Emittance Measurements using a Vertical Undulator”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOCB04, pp. 20-23.
K. P. Wootton, “A Distributed Beam Loss Monitor Based upon Activation of Oxygen in Deionised Cooling Water”, in Proc. North American Particle Accelerator Conf. (NAPAC'22), Albuquerque, NM, USA, Aug. 2022, pp. 433-436.
K. P. Wootton, “Direct Observation of Ultralow Vertical Emittance Using a Vertical Undulator”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 278-282.
K. P. Wootton, “Measuring Electromagnet Polarity Using Magnetic Remanence”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP014, pp. 354-357.
K. P. Wootton, H. Cease, M. Erdmann, S. M. Oprondek, M. Ramanathan, and B. X. Yang, “X-Ray Beam Position Monitor Silicon Photodiode Measurements for the Advanced Photon Source Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 46-50.
K. P. Wootton, J. L. McChesney, F. M. Rodolakis, N. Sereno, and B. X. Yang, “Transverse Emittance Measurement using Undulator High Harmonics for Diffraction Limited Storage Rings”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 674-678.
K. P. Wootton, R. P. Rassool, M. J. Boland, and B. C. C. Cowie, “APPLE-II Undulator Magnetic Fields Characterised from Undulator Radiation”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPF19, pp. 546-549.
K. P. Wootton, R. P. Rassool, M. J. Boland, B. C. C. Cowie, and R. T. Dowd, “Vertical Undulator Emittance Measurement: A Statistical Approach”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPF18, pp. 543-545.
K. P. Wootton, W. X. Cheng, G. Decker, N. Sereno, and F. Westferro, “Beamline for Time Domain Photon Diagnostics at the Advanced Photon Source Upgrade”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP016, pp. 363-367.
K. P. Wootton, W. X. Cheng, G. Decker, S. H. Lee, and B. X. Yang, “X-Ray Beam Size Monitor Enclosure for the Advanced Photon Source Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 34-36.


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