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Author: J. Rossbach


References



Reference
U. Fruehling et al., “Light Field Driven Streak-camera: Towards a Single Pulse Time Structure Measurement at FLASH”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper THDAU01, pp. 524-524.
V. Miltchev et al., “Tolerance Studies on the High Harmonic Laser Seeding at Flash”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH003, pp. 235-238.
J. Roensch et al., “First Measurement Results from the Upgraded Low Energy Longgitudinal Phase Space Diagnostics at PITZ”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH038, pp. 330-333.
M. Ferrario et al., “Recent Results of the SPARC Project”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH048, pp. 359-362.
R. Tarkeshian et al., “Conceptual Ideas for the Temporal Overlap of the Electron Beam and the Seed Laser for sFLASH”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH051, pp. 363-366.
S. Khan et al., “sFLASH: An Experiment for Seeding VUV Radiation at FLASH”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH072, pp. 405-408.
V. Miltchev et al., “sFLASH - Present Status and Commisioning Results”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA04, pp. 194-197.
J. Zemella, D. Novikov, M. Tolkiehn, J. Rossbach, and H. Sinn, “Study of a Silicon Based XFELO for the European XFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA07, pp. 202-205.
B. Faatz et al., “FLASH II: A Project Update”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA22, pp. 247-250.
S. Ackermann, V. Miltchev, and J. Rossbach, “Transverse Phase-space Studies for the Electron Optics at the Direct XUV-seeding Experiment at FLASH (DESY)”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper TUPA31, pp. 263-266.


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