|
J. D. Good et al., “New Ellipsoidal Photocathode Laser Pulses at the Upgraded PITZ Facility”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 439-443. |
|
Y. Renier et al., “Latest News on High Average RF Power Operation at PITZ”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 59-61. |
|
M. Krasilnikov et al., “Investigations on Electron Beam Imperfections at PITZ”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 165-167. |
|
B. Riemann, P. Grete, H. Huck, A. Nowaczyk, and T. Weis, “Combining Multiturn and Closed-Orbit Methods for Model-Independent and Fast Determination of Optical Functions in Storage Rings”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper MOP170, pp. 411-413. |
|
Y. Chen et al., “Space-Charge Dominated Photoemission in High Gradient Photocathode RF Guns”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 941-944. |
|
R. Niemczyk et al., “Proof-of-Principle Tests for Slit-scan-based Slice Emittance Measurements at PITZ”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 553-556. |
|
D. Schirmer et al., “Status of the Synchrotron Light Source DELTA”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper THPKF017, pp. 2296-2298. |
|
G. Schmidt et al., “Study for a Frequent Injection Mode at Delta with Beam Shutters Open”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper THPKF018, pp. 2299-2301. |
|
R. G. Heine, P. Hartmann, H. Huck, G. Schmidt, and T. Weis, “Investigation of Cavity Induced Longitudinal Coupled Bunch Mode Instability Behaviour and Mechanisms”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper WEPLT063, pp. 1990-1992. |
|
R. Niemczyk et al., “Comparison of YAG Screens and LYSO Screens at PITZ”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 438-440. |
