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Author: M. K. Sullivan


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Reference
Y. T. Yan et al., “Precision Measurement and Improvement of Optics for e+, e- Storage Rings”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper WEPCH062, pp. 2065-2067.
Y. T. Yan et al., “Virtual Accelerator for Accelerator Optics Improvement”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper MPPE058, pp. 3426-3428.
W. Kozanecki, Y. Cai, I. V. Narsky, J. Seeman, and M. K. Sullivan, “Experimental Study of Crossing-Angle and Parasitic-Crossing Effects at the PEP-II e+e- Collider”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPPP024, pp. 1874-1876.
M. K. Sullivan et al., “A Preliminary Interaction Region Design for a Super B-Factory”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPPP029, pp. 2077-2079.
J. Seeman et al., “Parameters of a Super-B-Factory Design”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPPP034, pp. 2333-2335.
J. Seeman et al., “Performance of the PEP-II B-Factory Collider at SLAC”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPPP035, pp. 2369-2371.
M. K. Sullivan, “IR Design for High Luminosity and Low Backgrounds”, in Proc. 62nd ICFA Advanced Beam Dynamics Workshop on High Luminosity Circular e+e- Colliders (eeFACT'18), Hong Kong, China, Sep. 2018, pp. 194.
Y. Funakoshi et al., “Early Commissioning of the Luminosity Dither System for SuperKEKB”, in Proc. 62nd ICFA Advanced Beam Dynamics Workshop on High Luminosity Circular e+e- Colliders (eeFACT'18), Hong Kong, China, Sep. 2018, pp. 212.
M. Boscolo et al., “Machine Detector Interface for the e+e- Future Circular Collider”, in Proc. 62nd ICFA Advanced Beam Dynamics Workshop on High Luminosity Circular e+e- Colliders (eeFACT'18), Hong Kong, China, Sep. 2018, pp. 201.
M. Masuzawa et al., “Early Commissioning of the Luminosity Dither Feedback for SuperKEKB”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 328-331.


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