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Author: K. Satou


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Reference
A. Kobayashi, H. Kuboki, K. Satou, and T. Toyama, “Upgrade of the Beam Position Monitoring System at the J-PARC Main Ring for High Intensity Operation”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 229-232.
B. Yee-Rendon et al., “Electron Cloud Measurements at J-PARC Main Ring”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 137-139.
B. Yee-Rendon et al., “Simulations of the Beam Loss Distribution at J-PARC Main Ring”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 4175-4177.
B. Yee-Rendon, R. Muto, K. Ohmi, K. Satou, M. Tomizawa, and T. Toyama, “Electron Cloud Simulations for the Main Ring of J-PARC”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 4436-4438.
G. H. Wei et al., “Beam Injection Tuning of the J-PARC Main Ring”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPEB015, pp. 3915-3917.
H. Harada et al., “The Result of Beam Commissioning in J-PARC 3-GeV RCS”, in Proc. 52nd ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'12), Beijing, China, Sep. 2012, paper TUO3C06, pp. 339-343.
H. Hotchi et al., “Beam Halo Reduction in the J-PARC 3-GeV RCS”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPP080, pp. 3918-3920.
H. Hotchi et al., “High-Intensity Demonstrations in the J-PARC 3-GeV RCS”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TU6PFP090, pp. 1504-1506.
H. S. Sandberg et al., “Measuring the Beam Profile by Counting Ionization Electrons”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 257-260.
J. W. Storey et al., “Development of an Ionization Profile Monitor Based on a Pixel Detector for the CERN Proton Synchrotron”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 470-473.


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