|
J. Chen, L. W. Lai, Y. B. Leng, L. Y. Yu, and N. Zhang, “Development of the Simulation Software Package for the CBPM System”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 349-351. |
|
R. X. Yuan, Y. B. Leng, L. Y. Yu, and W. M. Zhou, “Study of Beam Length Measurement based on TM010 Mode”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA45, pp. 162-164. |
|
Y. B. Yan, Y. B. Leng, L. Y. Yu, and W. M. Zhou, “SSRF BPM System Optimization and Upgrade”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA11, pp. 355-357. |
|
B. P. Wang, Z. C. Chen, Y. B. Leng, L. Y. Yu, R. X. Yuan, and W. M. Zhou, “Design of RF Front End for Cavity Beam Position Monitor based on ICs”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA22, pp. 383-385. |
|
L. Y. Yu, J. Chen, Y. B. Leng, K. R. Ye, and W. M. Zhou, “Design of the Beam Profile Monitors for the SXFEL Facility”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPB81, pp. 534-536. |
|
Y. B. Yan et al., “Beam Diagnostics System for a Photo-Neutron Source Driven by 15MeV Electron Linac”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC06, pp. 57-59. |
|
K. R. Ye et al., “Phase Space Measurement using X-ray Pinhole Camera at SSRF”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPF17, pp. 539-542. |
|
L. W. Lai et al., “Progress of Cavity Beam Position Monitor at SXFEL”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 399-401. |
|
J. Chen, L. W. Lai, Y. B. Yan, L. Y. Yu, R. X. Yuan, and Y. B. Leng, “Cavity BPM System for DCLS”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 661-664. |
|
L. W. Lai et al., “The Application of Direct RF Sampling System on Cavity BPM Signal Processing”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 278-280. |
