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Author: Z. C. Chen


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Reference
J. Chen, Z. C. Chen, G. Q. Huang, Y. B. Leng, K. R. Ye, and W. M. Zhou, “The Synchrotron Radiation Diagnostic Line at SSRF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB70, pp. 232-236.
Z. C. Chen, Y. B. Leng, and Y. B. Yan, “BPM Selection for Beam Current Monitoring in SSRF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA07, pp. 341-343.
B. P. Wang, Z. C. Chen, Y. B. Leng, L. Y. Yu, R. X. Yuan, and W. M. Zhou, “Design of RF Front End for Cavity Beam Position Monitor based on ICs”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA22, pp. 383-385.
Y. B. Yan et al., “Beam Diagnostics System for a Photo-Neutron Source Driven by 15MeV Electron Linac”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC06, pp. 57-59.
J. Chen, Z. C. Chen, Y. B. Leng, K. R. Ye, and R. X. Yuan, “Bunch Length Measurement With Streak Camera At SSRF Storage Ring”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC43, pp. 478-480.
K. R. Ye et al., “Phase Space Measurement using X-ray Pinhole Camera at SSRF”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPF17, pp. 539-542.
Z. C. Chen and Y. B. Leng, “Bunch-by-Bunch Study of the Transient State of Injection at the SSRF”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 396-398.
L. W. Lai et al., “Progress of Cavity Beam Position Monitor at SXFEL”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 399-401.
Y. B. Leng, H. J. Chen, J. Chen, Z. C. Chen, and Y. B. Yan, “Interferometer Data Analyzing Using the PCA Method at SSRF”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 402-404.
L. W. Lai et al., “BATCH APPLICATIONS OF DIGITAL BPM PROCESSORS FROM THE SINAP”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 658-660.


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