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Author: P. A. Chubunov


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Reference
V. S. Anashin, P. A. Chubunov, G. A. Protopopov, S. V. Mitrofanov, V. A. Skuratov, and Yu. G. Teterev, “Estimation of Heavy Ion Beam Parameters During Single Event Effects Testing”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 94-97.
S. A. Artamonov et al., “Universal Proton and Neutron Centre for Radiation Resistance of Avionic, Space Electronics and Other Applications at 1 Gev Synchrocyclotron in PNPI”, in Proc. 25th Russian Particle Accelerator Conf. (RuPAC'16), Saint Petersburg, Russia, Nov. 2016, pp. 105-107.
A. Issatov et al., “Modern Beam Monitoring Systems During SEE Testing on ISDE&JINR Heavy Ion Facilities”, in Proc. 26th Russian Particle Accelerator Conf. (RuPAC'18), Protvino, Russia, Oct. 2018, pp. 475-476.
P. A. Chubunov, V. S. Anashin, A. Issatov, and S. V. Mitrofanov, “Recent Advances in Beam Monitoring During SEE Testing on ISDE&JINR Heavy Ion Facilities”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 36-39.
A. S. Bychkov, P. A. Chubunov, A. S. Konyukhov, and A. A. Pavlov, “Analysis of Heavy Ion Irradiation Field Nonuniformity Using Track Detectors during Electronic Components Testing”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 381-382.
P. A. Chubunov, V. S. Anashin, A. S. Bychkov, I. V. Kalagin, A. E. Koziukov, and S. V. Mitrofanov, “Cyclotrons Based Facilities for Single Event Effects Testing of Spacecraft Electronics”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 348-352.
P. A. Chubunov, V. S. Anashin, S. V. Mitrofanov, and V. A. Skuratov, “JINR Heavy Ion Accelerators Application for SEE Testing in ISDE”, in Proc. 14th Int. Conf. on Heavy Ion Accelerator Technology (HIAT'18), Lanzhou, China, Oct. 2018, pp. 183-185.
P. A. Chubunov, V. S. Anashin, I. V. Kalagin, S. V. Mitrofanov, and V. A. Skuratov, “Modern Heavy Ion Based Test Facilities For Spacecrafts Electronics Qualification”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 3497-3499.


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