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Author: M. Gross


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Reference
M. Gross et al., “Upgrades of the Experimental Setup for Electron Beam Self-modulation Studies at PITZ”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2548-2550.
M. Khojoyan et al., “Beam Dynamics Studies for Particle Driven Plasma Wakefield Acceleration Experiments at PITZ”, in Proc. 11th Int. Computational Accelerator Physics Conf. (ICAP'12), Rostock-Warnemunde, Germany, Aug. 2012, paper THP08, pp. 236-238.
M. Krasilnikov et al., “An Option of High Charge Operation for the European XFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA08, pp. 481-484.
M. Krasilnikov et al., “Characterization of a single-pass high-gain THz FEL at PITZ”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPG68, this conference.
M. Krasilnikov et al., “High Brightness Photo Injector Upgrade and Experimental Optimization at PITZ”, in Proc. 2nd Int. Particle Accelerator Conf. (IPAC'11), San Sebastian, Spain, Sep. 2011, paper THPC114, pp. 3152-3154.
M. Krasilnikov et al., “Investigations on Electron Beam Imperfections at PITZ”, in Proc. 28th Linear Accelerator Conf. (LINAC'16), East Lansing, MI, USA, Sep. 2016, pp. 165-167.
M. Krasilnikov et al., “PITZ Experience on the Experimental Optimization of the RF Photo Injector for the European XFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUOANO04, pp. 160-168.
M. Krasilnikov et al., “PITZ Status, Recent Measurements and Tests”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD59, pp. 181-184.
M. Krasilnikov et al., “RF Performance of a Next-Generation L-Band RF Gun at PITZ”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 699-702.
M. Krasilnikov et al., “THz SASE FEL at PITZ: lasing at a wavelength of 100µm”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper THZG2, pp. 3948-3951.


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