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Author: M. A. Khojoyan


References



Reference
S. Rimjaem et al., “Emittance for Different Bunch Charges at the Upgraded PITZ Facility”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA06, pp. 473-476.
M. Krasilnikov et al., “An Option of High Charge Operation for the European XFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA08, pp. 481-484.
I. I. Isaev et al., “RF Photo Gun Stability Measurement at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA10, pp. 485-488.
M. A. Khojoyan, M. Krasilnikov, A. Oppelt, and F. Stephan, “Simulation Studies of Generating Ultra Short Pulses at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA15, pp. 499-502.
M. Otevrel et al., “Investigations on Thermal Emittance at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA23, pp. 519-522.
G. Asova et al., “First Results with Tomographic Reconstruction of the Transverse Phase Space at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA30, pp. 543-546.
M. Mahgoub et al., “Application and Design of the Streak and TV Readout Systems at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB27, pp. 613-616.
G. Asova et al., “Status of the Photo Injector Test Facility at DESY, Zeuthen Site (PITZ)”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE010, pp. 2164-2166.
S. Rimjaem et al., “Generating Low Transverse Emittance Beams for Linac Based Light Sources at PITZ”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE011, pp. 2167-2169.
M. Krasilnikov et al., “Recent Electron Beam Measurements at PITZ with a New Photocathode Laser System”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper MO6RFP057, pp. 491-493.


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