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Author: C. Evain


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Reference
C. Evain et al., “Microbunching Instability Studies at SOLEIL”, in Proc. 2nd Int. Particle Accelerator Conf. (IPAC'11), San Sebastian, Spain, Sep. 2011, paper MOPS048, pp. 709-711.
M.-A. Tordeux et al., “Low-alpha Operation for the SOLEIL Storage Ring”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP004, pp. 1608-1610.
A. Loulergue et al., “LUNEX5: A French FEL Test Facility Light Source Proposal”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP005, pp. 1611-1613.
C. Evain et al., “FEL Performances of the French LUNEX5 Project”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP050, pp. 1712-1714.
E. Roussel et al., “A New Scheme for Electro-optic Sampling at Record Repetition Rates : Principle and Application to the First (turn-by-turn) Recordings of THz CSR Bursts at SOLEIL”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2794-2797.
J. Raasch et al., “Electrical Field Sensitive High-Tc YBCO Detector for Real-time Observation of CSR”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 3533-3536.
M.-E. Couprie et al., “Progress of the LUNEX5 demonstator Project”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2856-2858.
E. Roussel et al., “Numerical Study of the Microbunching Instability at UVSOR-III: Influence of the Resistive and Inductive Impedances”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 1656-1658.
P. Ungelenk et al., “Studies of Ultrashort THz Pulses at DELTA”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 1936-1939.
C. Szwaj et al., “Single-Shot Electro-Optic Sampling Combined With Photonic Time-Stretch: Detailed Results at SOLEIL”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 795-797.


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