|
B. Steffen, F. M??ller, P. Peier, and V. Schlott, “Electro Optical Measurement of Coherent Synchrotron Radiation for Picosecond Electron Bunches With Few pC”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPA10, pp. 378-381. |
|
R. Ischebeck et al., “Response Matrix of Longitudinal Instrumentation in SwissFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper FROA4, pp. 652-655. |
|
R. Ischebeck et al., “Coherent Terahertz Radiation Monitors for Multiple Spectral Bands”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB06, pp. 572-575. |
|
P. N. Juranic et al., “THz Streak Camera for FELTemporal Diagnostics: Concepts and Considerations”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THA01, pp. 640-643. |
|
Ye. Ivanisenko, V. Schlott, and P. Peier, “Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP082, pp. 922-924. |
|
P. Peier, H. Dinter, and C. Gerth, “Coherent Radiation Diagnostics for Longitudinal Bunch Characterization at European XFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP083, pp. 925-928. |
|
M. Felber et al., “Implementation of MTCA.4-based Controls for the Pulsed Optical Synchronization Systems at DESY”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 115-117. |
|
P. Chevtsov, F. Mueller, V. Schlott, D. M. Treyer, P. Peier, and B. Steffen, “Electro Optical Beam Diagnostics System and its Control at PSI”, in Proc. 13th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'11), Grenoble, France, Oct. 2011, paper MOPKS019, pp. 195-198. |
|
B. Steffen, M. K. Czwalinna, C. Gerth, and P. Peier, “First Electro-Optical Bunch Length Measurements from the European XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 338-341. |
|
N. M. Lockmann, C. Gerth, P. Peier, B. Schmidt, and S. Wesch, “A Non-Invasive THz Spectrometer for Bunch Length Characterization at European XFEL”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2495-2497. |
